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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Spectroscopy Card
microDXP
The microDXP is a complete, low power compact digital spectroscopy card design for a wide range of handheld, benchtop and other embedded applications, lowering cost and speeding time-to-market.
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PXI Digital Test Instrument
PXIe-6943
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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PXIe, 28.2 Gbps, 48-Channel PXI High-Speed Serial Instrument
PXIe-7903 / 788917-01
The PXIe-7903 is designed for engineers who need high-performance FPGA coprocessing capabilities or who need to validate, interface through, and test serial protocols. It includes a Xilinx Virtex UltraScale+ FPGA to implement various high-speed serial protocols, and it is programmable with the LabVIEW FPGA Module for maximum application-specific customization and reuse. The PXIe-7903 takes advantage of FPGA multigigabit transceivers to deliver 48 TX and RX serial lanes.
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3-Axis Non-Robotic Automated Testing System
AT3
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Instrument Bracket Kit With Strain Relief, Slide Configuration, For 28" And Longer
310113453
Strain Relief
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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Instruments
Advanced Thermal Solutions, Inc.
ATS designs and fabricates the most extensive line of thermal test instruments specifically designed for the electronics industry. These research-quality, state-of-the-art instruments include Pressure, Temperature and Velocity Measurement Systems, Airflow and Heat Flux Controllers, Micron-level Thermography Systems and Cold-Plate Thermal Characterization Systems.
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Electronic Instruments
The ORTEC range of modular electronics includes instruments in NIM formats as well as other modular instruments, such as photomultiplier bases, preamplifiers and other accessories. ORTEC also offers modular instruments for pulse height spectroscopy, fast timing, counting, high voltage power supplies and other special functions.
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Instrumentation
Complementing our range of force and torque sensors, we offer a comprehensive range of graphical displays, including the Digiforce, which are PLC controllers and data loggers all in one. Together with a fully comprehensive range of standard high speed load cell displays with analogue output.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Instrumentation System
Reach Technologies has leveraged the success of its automotive instrumentation, and applied it to other industries. The availability of established CAN products, coupled with its robustness, makes CAN a cost effective instrumentation solution. The software back-end of our instrumentation system is comprised of a server to interface to the data loggers, a database server to manage the data, and a web server for control and data visualization.
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AVIO Instrument
The AVIO (Analog Voltage Input/Output) instrument has the functionality to operate as a DVM, oscilloscope, and signal generator. 16 channels for configuration as input or output, on-board memory, high speed feedback loop protects I/O from damaging electrical transients.
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Process instrumentation
Temperature measurement
Our product range includes both electronic and mechanical temperature measuring equipment and is constructed in a flexible modular way.The CombiTemp System includes a series of basic elements which can be combined as various temperature sensors and temperature measurement transmitters. The system also includes a wide array of connectors for standard processes and where hygiene rules apply.
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Instrumentation Amplifiers
Analog Devices instrumentation amplifiers (in-amps) are precision gain blocks that have a differential input and an output that may be differential or single-ended with respect to a reference terminal. These devices amplify the difference between two input signal voltages while rejecting any signals that are common to both inputs. The in-amps are widely used in many industrial, measurement, data acquisition, and medical applications where dc precision and gain accuracy must be maintained within a noisy environment, and where large common-mode signals (usually at the ac power line frequency) are present.
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Geophysical Instruments
SSR-MP-AT-SAL
Integrated Geo Instruments & Services Private Limited
The IGIS signal stacking based Signal Enhancement Resistivity Meter Model SSR-MP-AT-SAL is a state of art microprocessor based data acquisition system. The instrument design incorporates several innovative features and advanced techniques of digital circuitry to make it a reliable geophysical tool providing high quality data useful for mineral and groundwater exploration and any other geophysical applications.
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Corrosion Mitigation Instrumentation
AG-3
* At-Grade CP Test Station* Below Grade CP Test Station* Suitable for low traffic areas such as, easements, sidewalks,tank farms etc.
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Handheld Instruments
Measuring DC and AC voltages up to 1000 V.Alternating current and direct current with resolution up to 0.01 mA.Measuring continuity, resistance, diodestest, capacity, frequency.MIN / MAX recording.CAT III 1,000 V, Cat IV 600 V; IP54.Wireless remote display. Smartphone connection.Fluke Connect Mobile App for Android and iOS, compatible with over 20 different Fluke products.
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Inspection Instrument for Indicators
i-Checker
The i-Checker is specially designed to calibrate measuring accuracy of dial indicators, dial test indicators, and other electronic comparison gage heads with a stroke of up to 100mm (4").±(0.2+L/100)µm indication accuracy. Directly inspects an indicator with a stroke of up to 100mm (4"). The dial test indicator, bore gage and lever-type inductive head can be inspected with optional accessories. Adjustment of the measurement position is very easily accomplished because of semi-automatic measurement and full automatic measurement functions. Creates and prints out the simple inspection certificate. Saves inspection result as CSV file for reusable inspection result by any kind of software.
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Process Ozone Instruments
Teledyne Advanced Pollution Instrumentation
All of our instruments are designed meet the rigorous demands of ambient air quality, stack, or industrial process gas monitoring. Below is a list of a range of Teledyne API process ozone instruments.
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Instrument Measurement Software
Get quick insights and reduce the test time of your devices with instrument measurement software or test instrument software specifically designed for spectrum analyzers, oscilloscopes, network analyzers, and many more test instruments.





























